A high performance scanning force microscope head design

نویسندگان

  • Steven M. Clark
  • John D. Baldeschwieler
  • A. A. Noyes
چکیده

Since its inception in 1985, the atomic force microscope’ [also known as the scanning force microscope (SFM)] has held great promise for imaging nonconducting samples with subnanometer resolution. Early attempts to image relatively inelastic samples such as graphite, crystals of ionic salts, and semiconductors yielded atomic resolution data. These data provided reason to believe that SFM might be applied easily to the study of biomaterials. However, as more compliant samples were examined, it became clear that several factors limit resolution on elastic samples. Among these factors are (i) unavoidable forces involved in tip-sample interaction, (ii) tip shape, (iii) sample motion, both scan induced and thermal, and (iv) instrument and detection noise. Progress has been made in all of these areas; for example, imaging with both sample and cantilever immersed in liquid to reduce meniscus forces,’ electron beam deposition of tips to increase tip sharpness,3 imaging with specially prepared substrates to increase sample adhesion during imaging,4 as well as efforts to image at low temperature to eliminate Brownian motion of the sample.’ Other investigators have focused on sources of instrument noise and their reduction.6 This article describes a design to reduce mechanical noise and increase the stability of a SFM stage so that it exceeds the requirements for imaging biomaterials. Establishing the force level acceptable for biomolecular imaging is difficult; it depends on the sample, preparation procedures, imaging environment, and other factors. Theoretical discussions of tolerable forces for biological samples advocate applied forces in the 10-lo-lO-ll N range.7’8 We have used the more conservative lo-” N figure as a design goal for the SFM stage presented. One consequence of this force criterion is that, for stiff micromachined cantilevers (which have spring constants z 1 N/m) motions larger than 0.1 A are unacceptable. We have designed a SFM head that achieves stability andvibrational amplitudes less than this level. The body of this article describes the design of the SFM head and discusses the most important factors considered during the design process.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

A stand-alone scanning force and friction microscope

We present a new design for a compact stand-alone force and friction microscope. Both the force sensor and the scanning unit are mounted on the microscope head, thus allowing the investigation of virtually all surfaces, independent of thickness and size, and minimizing the geometrical dimension. The beam deflection method in a collinear arrangement is used to detect the normal force and the fri...

متن کامل

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers.

We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and...

متن کامل

A compact fluorescence and polarization near-field scanning optical microscope

We present a transmission, fluorescence, and polarization near-field scanning optical microscope with shear-force feedback control that is small in size and simple to operate. This microscope features an ultrafine mechanical tip/sample approach with continuous manual submicron control over a range of several millimeters. The piezo-driven 12 mm x-y scan range is complimented by a 4 mm coarse mec...

متن کامل

Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy

Related Articles Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis Rev. Sci. Instrum. 83, 063702 (2012) High-speed Lissajous-scan atomic force microscopy: Scan pattern planning and control design issues Rev. Sci. Instrum. 83, 063701 (2012) High potential sensitiv...

متن کامل

A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points.

One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of "light and stiff" and "static determinacy," the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 1999